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Sample preparation:

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Arc melting is a versatile technique for the preparation of intermetallic alloys from constituent metals with a very high melting point. In this process, an electric arc is produced inside the melting chamber to melt the starting materials and fuse them to get an alloy. During the process of melting temperature as high as ~ 3000 ºC is produced inside the chamber, which is sufficiently high for melting the constituent elements of the alloy. Heating is generated by an electric arc struck between a tungsten electrode and metals placed in a depression (crucible) in the copper hearth.

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​Sputtering is an effective tool for the deposition of high-quality thin films. This technique is also useful for the deposition of alloy films of uniform thickness with better reproducibility. Sputter deposition is also advantageous for large-area deposition of films that are required for industrial applications. The target (material which is to be deposited) atoms after knocked out by the highly energetic gaseous ions in plasma (formed by the Ar gas) condense on the surface of the substrate to form a thin film. The target is used as a cathode, and the substrate (the base material on which the film is deposited) acts as an anode. Ar gas is fed into the sputtering chamber and a voltage of a few 100 V is applied between the target and anode to create the plasma.​

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X-Ray Diffractometer (XRD): SoP, UoH
X-ray diffraction (XRD) is the laboratory technique that reveals structural information, such as crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction to solids, thin films and nanomaterials.
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​Field Emission Scanning Electron Microscope (FESEM): SoP, UoH
EDX (also referred to as EDS or EDAX) technique can be used to determine the elemental composition or chemical characterization of the samples. Generally, the EDX setup is attached with a scanning electron microscopy (SEM) instrument. This spectroscopy relies on the study of sample through interactions among matter (sample) and electromagnetic radiation.

​Physical Properties Measurement System (PPMS): UoH
The DynaCool physical property measurement system (PPMS) is widely used to study the magnetic and electrical transport properties of materials as a function of magnetic field and temperature of different materials prepared in the form of bulk, thin film, and powder.

Other Facilities: Centre for Nanotechnology, UoH

  • Electron beam & Thermal evaporation system

  • Electron Beam Lithography

  • Transmission Electron Microscope (TEM)

  • TEM sample preparation facility

  • Profilometer

  • Wire Bonder

  • Cleanroom

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